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This month's cover image is from the featured paper, by Yingzi Li, Liwen Zhang, Guanqiao Shan, Zihang Song, Rui Yang, Hua Li, and Jianqiang Qian.Ìý DOI: 10.1119/10.1119/1.4941929

Atomic force microscopes are a key tool in nanotechnology that overcome the limitations of optical microscopes and provide imaging capabilities with nanoscale resolution. We have developed an atomic force microscope that uses an inexpensive quartz tuning fork as a micro cantilever. Because of its ease of operation and its open structure, it can be easily customized by students. Due to its low costs, it is possible that every student in the course has access to one setup, allowing all students to obtain deep insights into nanotechnology and to understand the principles of atomic force microscopy.

Papers

Ìý DOI: 10.1119/1.4945266

by Vadim N. Matvejev, Oleg V. Matvejev and Ø. Grøn Ìý DOI: /10.1119/1.4942168

by Felipe Le Vot, Juan J. Meléndez and Santos B. Yuste. Ìý DOI: 10.1119/1.4944706

by J. K. Bhattacharjee and D. S. Ray. Ìý DOI: /10.1119/1.4944701

byJulio Güémez, Manuel Fiolhais and Luis A. Fernández. Ìý DOI: 10.1119/1.4941569

by Mark G. Alford.Ìý Ìý DOI:10.1119/1.4945408

PHYSICS EDUCATION RESEARCH